Zeitschriftenartikel
Morell, H.;
Angermund, K.;
Lewis, A. R.;
Brouwer, D. H.;
Fyfe, C. A.;
Gies, H. Structural investigation of Silicalite-I loaded with n-hexane by X-ray diffraction, Si-29 MAS NMR, and molecular modeling.
Chemistry of Materials 2002,
14, 2192–2198.