Journal Article
Morell, H.;
Angermund, K.;
Lewis, A. R.;
Brouwer, D. H.;
Fyfe, C. A.;
Gies, H. Structural Investigation of Silicalite-I Loaded with n-Hexane by X-Ray Diffraction, Si-29 MAS NMR, and Molecular Modeling.
Chemistry of Materials 2002,
14, 2192–2198.