Journal Article
Asahina, S.;
Suga, M.;
Takahashi, H.;
Jeong, H. Y.;
Galeano Nunez, D. C.;
Schüth, F.;
Terasaki, O. Direct Observation and Analysis of York-Shell Materials Using Low-Voltage High-Resolution Scanning Electron Microscopy: Nanometal-Particles Encapsulated in Metal-Oxide, Carbon, and Polymer.
APL Materials 2014,
2, 113317–113311-113317–113317.