Scanning Electron Microscopy (SEM)
Scanning electron microscopy is employed to visualize details of the sample surface on the nano meter scale.
- Ultra high resolution scanning electron microscopy with a point resolution of up to 4 Å at 30 kV (Hitachi S-5500)
- Combination with bright field and dark field scanning transmission electron microscopy (STEM)
- Elemental analysis using EDS achieving nano meter resolution
- SEM of bulk samples in combination with EDS and under variable pressure (Hitachi S-3500N)